The GE / Nutronik UTxx Electronic Ultrasonic Test System is the successor to the earlier analog UT electronic NIM generation and the digital-analog hybrid 20.00 equipment.
A special mathematical technique patented by GE / Nutronik has made it possible to dramatically improve the resolution of time of flight and amplitude.
The capabilities of this system exceed those of all previous generations. The central element of the UTxx electronic ultrasonic testing system consists of a channel-oriented digital electronic testing system.
It is parallel, multi-channel and modular oriented and achieves high test throughputs at reasonable cost levels in automated test systems.