The PXIe-5172 from National Instruments (now part of Emerson) is a high-performance PXI oscilloscope module, model 784225-01, with eight synchronous sampling channels that provide flexible coupling and voltage range Settings. With its analog bandwidth of 100MHz and sampling rate of up to 250MSPS, this oscilloscope is ideal for applications requiring high-speed data acquisition and accurate time benchmarks. The PXIe-5172 is also equipped with a programmable Kintex-7 325T or 410T FPGA, which enables it to perform custom acquisition, triggering, signal processing and data streaming, further enhancing its flexibility and functionality in complex test and measurement tasks.
National Instruments releases new PXIe-5172 oscilloscope module to enhance multi-channel testing capabilities
Subtitle: The PXIe-5172 oscilloscope module sets a new standard for high-speed data acquisition and accurate measurement with its high performance and flexibility
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National Instruments, a leading provider of test, measurement and control solutions, announced the introduction of the new PXIe-5172 oscilloscope module, Model 784225-01. With its excellent performance and advanced technical features, this oscilloscope module meets the needs of high-speed and high-precision measurement in the field of modern electronic testing.
Key features of the PXIe-5172 include:
8 synchronous sampling channels: Provides multi-channel data acquisition capability for complex signal analysis.
100MHz analog bandwidth: ensures the ability to capture subtle changes in high-frequency signals.
250MSPS Sampling rate: provides high-speed data acquisition to meet the needs of high-speed signal testing.
Flexible coupling and voltage range Settings: adapt to different test environments and signal characteristics.
Programmable Kintex-7 FPGA: Supports custom acquisition, triggering, signal processing, and data flow for increased application flexibility.
Advanced PXI synchronization function: Support multi-device synchronization operation, improve the overall test efficiency of the system.
The PXIe-5172 oscilloscope module is suitable for a variety of applications, including but not limited to aerospace, defense and security, automotive electronics, communications and consumer electronics product testing and verification. The launch further enriches National Instruments’ product line in the PXI modular instrument area, providing customers with more comprehensive and high-performance test solutions.
National Instruments is committed to providing customers with reliable and efficient test and measurement tools through its innovative spirit and relentless pursuit of product quality. The launch of the PXIe-5172 oscilloscope module once again demonstrates the company’s leadership in driving the development of test and measurement technology.