VMIVME-2536 32-Channel Optically Coupled Digital I/O Board with Built-in-Test VMIC

Description

Overview

Essential details：VMIVME-2536 32-Channel Optically Coupled Digital I/O Board with Built-in-Test VMIC

Features:
• 32 optically coupled outputs
• 32 optically coupled inputs
• High isolation potential
– 1kV sustained
– 35kV pulsed
• 8-, 16-, 32-bit data transfers
• Standard data or short I/O addressing A16 or A24
• Voltage sensing or contact sensing inputs
• Input ranges of 5 to 125VDC
• 300mA current sinking outputs Supports Built-in-Test for both inputs and outputs
• 50V maximum output voltage

VMIVME-2536

Functional Characteristics
Board Function: This board has 32 optically coupled inputs and 32 optically coupled outputs. Both the outputs and inputs have Built-in-Test capability and provide a sustained 1kV of system isolation to the VME backplane.
Compliance: This board complies with the VMEbus specification ANSI/IEEE STD 1014-1987 IEC 821 and 297 with the following mnemonics: A24/A16, D32/D16/D08(EO)
Slave with the following Address Modifiers: 3D,39/2D,29.
Built–in-Test: The VMIVME-2536 supports both online and offline Built-in-Test (BIT).
Inputs are put into the test mode by setting a bit in the Control and Status Register (CSR). While in the test mode, data placed in onboard test registers are read through the input ports instead of field data. The test registers are at the same address as the input data ports, allowing testing to be achieved by simply writing to and reading from the input data ports. This feature is used for both online and offline testing.
The contents of the Output Data Registers may be read at anytime, thereby supporting online testing. The outputs may be put into offline test mode by setting a bit in the CSR. In the offline test mode, the open-collector outputs are all disabled. Data patterns may then be written to and read from the Output Registers for test purposes without affecting the outputs.

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Superiority products VMIVME-2536 32-Channel Optically Coupled Digital I/O Board with Built-in-Test VMIC