National Instruments (NI) recently announced the introduction of the new PXIe-5110 oscilloscope, bringing innovative solutions to the field of test and measurement. With its analog bandwidth of up to 100 MHz and sampling rate of 1 GS/s, this high-performance oscilloscope meets the needs of high-speed signal measurement and analysis, especially suitable for automation and partial automation applications.

The PXIe-5110 oscilloscope features two channels that support flexible and programmable coupling, input impedance, voltage range, and filter Settings. It also comes with multiple trigger modes, high-capacity onboard memory, and an instrument driver that enables high-speed data transfer. In addition, the oscilloscope has multiple analysis functions built in, allowing users to quickly perform complex signal analysis and measurement.

“The introduction of the PXIe-5110 oscilloscope marks a further development in the field of high-performance test and measurement equipment,” said a technical lead at NI. “It not only improves measurement flexibility and accuracy, but also provides engineers with powerful tools to meet their stringent test efficiency and accuracy requirements.”

Some models of the PXIe-5110 also support CableSense™ technology, which detects and locates faults, changes or discontinuities in the signal path, further improving the reliability and efficiency of the test and measurement process.

The PXIe-5110 oscilloscope has a wide range of applications, suitable for aviation, automotive, semiconductor and general electronics testing and many other industries, especially in the need for high-speed, high-precision measurement, such as signal integrity analysis, power integrity testing and high-speed digital signal debugging.

Concluding remarks:

With the increase of the complexity of electronic systems, the requirements for test and measurement equipment are getting higher and higher. NI’s PXIe-5110 oscilloscope, with its superior performance and advanced technology, provides engineers with a powerful tool to address these challenges. We look forward to the worldwide application of this oscilloscope to make important contributions to the development of test and measurement technology.