National Instruments (NI) today announced the launch of its new high-performance PXIe-5186 digital oscilloscope module, designed for applications that require accurate measurement and fast signal capture. With its analog bandwidth of 5 GHz and sampling rate of 12.5 GS/s, the PXIe-5186 is well suited for the digitization and analysis of high-speed signals.

This digital oscilloscope module has the following features:

Two voltage input channels support input impedance of 50 Ω and 1 MΩ, providing flexibility for different measurement needs.
Flexible coupling, voltage range, and filtering options are available to suit a variety of test environments.

PXIe-5172

Tektronix Enabling Technology™, combined with NI Synchronization and Memory Core (SMC) technology, provides extensive analog bandwidth and high-speed sampling capabilities through TClk synchronization.
Support for multiple trigger types, including edge trigger, digital trigger, immediate trigger and software trigger, ensures accurate signal capture.
Rich software support is provided, including NI-SCOPE driver software and application interfaces for a variety of development environments.
The introduction of the PXIe-5186 further expands NI’s portfolio of high-performance test and measurement solutions and is expected to play an important role in high-speed data acquisition, communications testing, semiconductor testing and aerospace.