ZMI4104 laser interferometer

The ZMI-4104 is a laser interferometer from ZYGO for the measurement of surface topography and displacement. Based on the principle of interference, the product offers high accuracy and reliability, especially for measurement scenarios requiring nanoscale accuracy.
Second, product characteristics
High accuracy: The ZMI-4104 has a high precision measurement capability, with a measurement error of less than 0.25μm and a resolution of 0.1nm.
High stability: Unique product design ensures stability and reliability during measurement.
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Description

Overview


Essential details:ZMI4104 laser interferometer

Product Description

ZMI-4104 Product description
I. Product overview
The ZMI-4104 is a laser interferometer from ZYGO for the measurement of surface topography and displacement. Based on the principle of interference, the product offers high accuracy and reliability, especially for measurement scenarios requiring nanoscale accuracy.
Second, product characteristics
High accuracy: The ZMI-4104 has a high precision measurement capability, with a measurement error of less than 0.25μm and a resolution of 0.1nm.
High stability: Unique product design ensures stability and reliability during measurement.
High resolution: Imaging resolution up to 1000×1000 pixels ensures that the details of the measured results are clearly visible.
High-speed data acquisition: data acquisition time only 302ms, fast response, improve measurement efficiency.
Multi-field applications: widely used in semiconductor, optics, communications, aerospace, automation and scientific research fields.

ZMI-4104

Product parameter

Wavelength: 633nm
Frequency stability: <0.0001nm
Coherent length: >100m
Frame rate: 43Hz
Data mode: 8 bits
Amplification: electronic control digital display amplification 1-5X
Polarization: Near circular polarization (1.2:1 or better)
Focus range: 4 “:±2.5m; 6 “: + / – 5.5 m

APPLICATION

The ZMI-4104 is used in a wide variety of scenarios requiring nanoscale measurements, including but not limited to:
Semiconductor manufacturing: Used for the measurement of semiconductor cutting tools, chips and other precision components.
Optical manufacturing: measuring the surface morphology, refractive index and other parameters of optical components.
Automotive manufacturing: Provide measurement support in high-precision machining processes such as automotive engine nozzle and precision parts processing.
Scientific research field: Provide important measurement tools for the research of nanotechnology, precision machining and other fields.

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